Influence of dimer buckling on dimer diffusion: A scanning tunneling microscopy study

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Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy

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ژورنال

عنوان ژورنال: Physical Review B

سال: 2006

ISSN: 1098-0121,1550-235X

DOI: 10.1103/physrevb.73.073311